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BACK ELECTRODE INFLUENCE ON OPTO-ELECTRONIC PROPERTIES OF ORGANIC PHOTOVOLTAIC BLEND CHARACTERIZED BY KELVIN PROBE FORCE MICROSCOPY

1 ČERMÁK Jan
Co-authors:
1,2 MILIAIEVA Daria 3 HOPPE Harald 1,2 REZEK Bohuslav
Institutions:
1 Institute of Physics, Czech Academy of Sciences, Prague, Czech Republic, EU, cermakj@fzu.cz
2 Czech Technical University, Faculty of Electrical Engineering, Prague, Czech Republic, EU
3 Center for Energy and Environmental Chemistry Jena, Jena, Germany, EU
Conference:
8th International Conference on Nanomaterials - Research & Application, Hotel Voronez I, Brno, Czech Republic, EU, October 19th - 21st 2016
Proceedings:
Proceedings 8th International Conference on Nanomaterials - Research & Application
Pages:
291-295
ISBN:
978-80-87294-71-0
ISSN:
2694-930X
Published:
17th March 2017
Proceedings of the conference were published in Web of Science and Scopus.
Metrics:
553 views / 254 downloads
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Abstract

Organic photovoltaic (PV) system consisting of P3HT:PCBM blend layer was prepared with an aluminum (Al) back electrode. After the final thermal annealing the Al layer was partially removed. Kelvin Probe Force Microscopy (KPFM) was used to measure photovoltage response to illumination by a solar spectrum light as a function of time (up to 3 weeks). Comparison of the same KPFM measurement on the areas with and without Al revealed differences in both morphology and photovoltage response to illumination. The data are discussed with view to reducing degradation of organic PV devices.

Keywords: Organic photovoltaics, Kelvin Probe Force Microscopy, degradation

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