APPLICATION OF SMED METHODOLOGY IN DEEP DRAWN STAMPING

1 BALON Petr
Co-authors:
1 BUCHTOVÁ Jana
Institution:
1 VSB - Technical University of Ostrava, Ostrava, Czech Republic, EU petr.balon.st@vsb.cz, jana.buchtova@vsb.cz
Conference:
24th International Conference on Metallurgy and Materials, Hotel Voronez I, Brno, Czech Republic, EU, June 3rd - 5th 2015
Proceedings:
Proceedings 24th International Conference on Metallurgy and Materials
Pages:
1835-1840
ISBN:
978-80-87294-58-1
ISSN:
2694-9296
Published:
12th January 2015
Proceedings of the conference were published in Web of Science and Scopus.
Metrics:
480 views / 212 downloads
Abstract

The paper describes the application of SMED methodology in a chosen enterprise dealing with production of deep drawn steel parts for automotive industry. Acronym SMED stands for "Single Minute Exchange of Die". The main goal of SMED methodology is to reduce the time needed for tool exchange and adjustment. Radical shortening of these times, for instance from several hours to a few minutes, is achieved progressively by changes in the tool exchange organization, standardization of the tool exchange procedures, staff training, special aids and technical modifications of the tool or of the press machine. The aim is to move as many internal activities as possible into external. The internal activities are those that are done during machine shutdown, the external activities are done while the machine is running. The goal of this paper is to define the main contributions of SMED methodology application in the case of the chosen product series running on a specific machine. The instrument used to achieve the intended aim is the above defined sequence of SMED methodology steps.

Keywords: Deep drawn stamping, SMED methodology, external activities, internal activities, tool exchange.

© This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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