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EVALUATION OF TWO-WAY SHAPE MEMORY EFFECT IN BI-LAYER NITI THIN FILM

1,2 Nili-Ahmadabadi Mahmoud
Co-authors:
1,3 Mohri Maryam
Institutions:
1 School of Metallurgy and Materials Engineering, College of Engineering, University of Tehran, Tehran, Iran
2 Center of Excellence for High Performance Materials, University of Tehran, Tehran, Iran
3 Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany
Conference:
24th International Conference on Metallurgy and Materials, Hotel Voronez I, Brno, Czech Republic, EU, June 3rd - 5th 2015
Proceedings:
Proceedings 24th International Conference on Metallurgy and Materials
Pages:
1312-1319
ISBN:
978-80-87294-58-1
ISSN:
2694-9296
Published:
12th January 2015
Proceedings of the conference were published in Web of Science and Scopus.
Metrics:
391 views / 250 downloads
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Abstract

One bi-layer Ni-Ti thin films with chemical compositions of Ni45TiCu5/Ni50.8Ti (numbers indicate at.%) determined by energy dispersive X-ray spectroscopy was deposited on Si substrates using RF magnetron sputtering. The structures and transformation temperatures of annealed thin films at 773 K for 1 h were studied using grazing incidence X-ray diffraction (GIXRD) and differential scanning calorimetry (DSC), respectively. Nanoindentation was used to characterize the mechanical properties.The DSC and X-ray diffraction results indicated the bi-layer was composed of austenitic and martensitic thin films. The bi-layer thin film exhibited a combined pseudo elastic behavior and shape memory effect at the same time similar to the austenitic and martensitic thin films, respectively. The combination of pseudo elastic with shape memory effect produces a two-way shape memory effect with a reduced hysteresis in the bi-layers.

Keywords: NiTi bi-layer thin film, pseudo elastic, two-way shape memory effect

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